Yarn Analysis System
INTRODUCTION
The YAS uses the latest optical technology to predict the appearance of spun yarns in fabric. It uses a high-resolution CCD camera and software to record and map the size and length of yarn imperfections. More factual information is generated which eliminates results averaging.
Software
Imperfections can be viewed on a computer graphic simulation of a yarn grading card. Defects can be assigned into bins according to length, and the yarn appearance is graded. Visual and statistical grading of yarn appearance takes less than one minute of test time. This method simulates the ASTM method for grading yarn appearance and provides consistent, reliable and reproducible results.
FEATURES
- Width of computer grading card can be changed to view periodic defects.
- Simulates different yarn clearing settings on appearance automatically
- Tests may be recalled at any time.
INSTRUMENT SIZE
| Depth: | 47 in. (119cm) | ||
| Height: | 30 in. (76cm) | ||
| Width: | 63 in. (160cm) | ||
| Weight: | 405 lbs. (220kg) |
CONNECTIONS
Power: 115/220 VAC - 50/60 Hz
ORDERING INFORMATION
Catalog Number:
LH-481 YAS
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